Ideal for examination cross section of thin samples, such as wafers, multi-layer of capacitors, plastics, metals, etc.
- For most AMRAY: ½" diameter (12.7mm), 1/8" (3.1mm)dia. pin (3.1mm) with split openings up to ¼" (6.4mm). Available with either 8mm (5/16") pin height or 15mm (9/16") pin height.
- For ISI, JEOL, TOPCON: Double set screw for a secure holding of the specimen during observation. 15mm(9/16")(dia). x 10mm(3/8")(H), 6.4mm(1/4") split.